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【英文标准名称】:StandardTestMethodforRadiologicExaminationofSemiconductorsandElectronicComponents
【原文标准名称】:半导体和电子元件放射性检验的标准试验方法
【标准号】:ASTME1161-2003
【标准状态】:现行
【国别】:
【发布日期】:2003
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E07.01
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:金相学;金属;放射性试验;无损检验;电气工程;半导体;试验;元部件
【英文主题词】:electronicdevices;nondestructivetesting;radiographic;radioscopy;semiconductors;X-Ray
【摘要】:Thistestmethodisusefulfordeterminationofvoidinginsemiconductorelementtoheadermountingmaterial,glassseal,andlidsealareas.Itisalsousefulforexaminationoftheinternalcavitiesofdevicesforextraneousmaterial,wiredress,andbondplacementforunattachedelements.1.1Thistestmethodprovidesastandardprocedurefornondestructiveradiographicexaminationofsemiconductordevices,electroniccomponents,andthematerialsusedforconstructionoftheseitems.Thistestmethodcoverstheradiographicexaminationoftheseitemsforpossibledefectiveconditionssuchasextraneousmaterialwithinthesealedcase,improperinternalconnections,voidsinmaterialsusedforelementmounting,orthesealingglass,orphysicaldamage.1.2Thequalitylevelandacceptancecriteriaforthespecimensbeingexaminedshallbespecifiedinthedetaildrawing,purchaseorderorcontract.1.3Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:
【页数】:4P.;A4
【正文语种】: